Further Resources
Microstructure Characteriazation:
A state-of-the-art high resolution scanning electron microscope (SEM) are available for materials microstructure measurement. The group also has a range of optical microscopes and equipment for specimen preparation.
Strain Mapping:
Sonatest precision thickness gauge with the resolution of 0.001 mm and velocity range of 1250 to 10,000 meter/sec allows the measurement of the thickness of material without removing paint or coating.
Computational Systems:
Several advanced computer with advanced configuration are available, for numerical and computational analysis. Several smaller computers for parallel computations are also available for group usage.